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Joint inversion of strain and tilt data using the Akaike’s Bayesian information criterion to map detailed slip distributions of short-term slow slip events
https://nied-repo.bosai.go.jp/records/5098
https://nied-repo.bosai.go.jp/records/5098ea0c1492-304a-4174-9e37-70f047d30ff7
| Item type | researchmap(1) | |||||||||||||||
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| 公開日 | 2024-04-29 | |||||||||||||||
| タイトル | ||||||||||||||||
| 言語 | en | |||||||||||||||
| タイトル | Joint inversion of strain and tilt data using the Akaike’s Bayesian information criterion to map detailed slip distributions of short-term slow slip events | |||||||||||||||
| 著者 |
Takahiro Tsuyuki
× Takahiro Tsuyuki
× Akio Kobayashi
× Reiko Kai
× Takeshi Kimura
× Satoshi Itaba
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| 抄録 | ||||||||||||||||
| 内容記述タイプ | Other | |||||||||||||||
| 内容記述 | Abstract Along the Nankai Trough subduction zone, southwest Japan, short-term slow slip events (SSEs) are commonly detected in strain and tilt records. These observational data have been used in rectangular fault models with uniform slip to analyze SSEs; however, the assumption of uniform slip precludes the possibility of mapping the slip distribution in detail. We report here an inversion method, based on the joint use of strain and tilt data and evaluated in terms of the Akaike’s Bayesian information criterion (ABIC), to estimate the slip distributions of short-term SSEs on the plate interface. Tests of this method yield slip distributions with smaller errors than are possible with the use of strain or tilt data alone. This method provides detailed spatial slip distributions of short-term SSEs including probability estimates, enabling improved monitoring of their locations and amounts of slip. | |||||||||||||||
| 言語 | en | |||||||||||||||
| 書誌情報 |
en : Earth, Planets and Space 巻 73, 号 1, 発行日 2021-12 |
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| 出版者 | ||||||||||||||||
| 言語 | en | |||||||||||||||
| 出版者 | Springer Science and Business Media LLC | |||||||||||||||
| ISSN | ||||||||||||||||
| 収録物識別子タイプ | EISSN | |||||||||||||||
| 収録物識別子 | 1880-5981 | |||||||||||||||
| DOI | ||||||||||||||||
| 関連識別子 | 10.1186/s40623-021-01517-x | |||||||||||||||
